Gaussian diffraction model for Sb thin films in super-resolution near-field structure
Data(s) |
2005
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Resumo |
SPIE |
Identificador | |
Idioma(s) |
英语 |
Publicador |
SPIE |
Direitos |
2 |
Fonte |
Qingling Qu, Yang Wang, Liyong Ren, Jingsong Wei, Fuxi Gan.Gaussian diffraction model for Sb thin films in super-resolution near-field structure.见:Seventh International Symposium on Optical Storage.湛江.2005-04-01-2005-04-06. |
Palavras-Chave | #Fresnel-kirchhoff diffraction theory #Gaussian diffraction model |
Tipo |
会议论文 |