Gaussian diffraction model for Sb thin films in super-resolution near-field structure


Autoria(s): Qingling Qu; Yang Wang; Ren LY(任立勇); Jingsong Wei; Fuxi Gan
Data(s)

2005

Resumo

SPIE

Identificador

http://ir.opt.ac.cn/handle/181661/8095

http://www.irgrid.ac.cn/handle/1471x/71006

Idioma(s)

英语

Publicador

SPIE

Direitos

2

Fonte

Qingling Qu, Yang Wang, Liyong Ren, Jingsong Wei, Fuxi Gan.Gaussian diffraction model for Sb thin films in super-resolution near-field structure.见:Seventh International Symposium on Optical Storage.湛江.2005-04-01-2005-04-06.

Palavras-Chave #Fresnel-kirchhoff diffraction theory #Gaussian diffraction model
Tipo

会议论文