Modeling of Thermal Phenomena in a High Power Diode Laser Package


Autoria(s): Ephraim Suhir; Jingwei Wang; Zhenbang Yuan; Xu Chen; Xingsheng Liu
Data(s)

13/01/2010

Identificador

http://ir.opt.ac.cn/handle/181661/7964

http://www.irgrid.ac.cn/handle/1471x/70992

Idioma(s)

中文

Fonte

Ephraim Suhir, Jingwei Wang, Zhenbang Yuan, Xu Chen, Xingsheng Liu.Modeling of Thermal Phenomena in a High Power Diode Laser Package.见:10th on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP).Beijing.2009-08.

Palavras-Chave #电子、电信技术 #电子、电信技术::半导体器件与技术 #semiconductor laser arrays #thermal failures #finite-elementanalysis (FEA)
Tipo

会议论文