In-plane optical anisotropy in GaAsN/GaAs single-quantum well investigated by reflectance-difference spectroscopy


Autoria(s): Yu JL (Yu J. L.); Chen YH (Chen Y. H.); Ye XL (Ye X. L.); Jiang CY (Jiang C. Y.); Jia CH (Jia C. H.)
Data(s)

2010

Resumo

The interface properties of GaNxAs1-x/GaAs single-quantum well is investigated at 80 K by reflectance difference spectroscopy. Strong in-plane optical anisotropies (IPOA) are observed. Numerical calculations based on a 4 band K . P Hamiltonian are performed to analyze the origin of the optical anisotropy. It is found that the IPOA can be mainly attributed to anisotropic strain effect, which increases with the concentration of nitrogen. The origin of the strain component epsilon(xy) is also discussed.

Submitted by 阎军 (yanj@red.semi.ac.cn) on 2010-08-17T01:40:04Z No. of bitstreams: 1 JApplPhys_108_013516.pdf: 259380 bytes, checksum: 164599214d7e14cadb24bf76f2dff61b (MD5)

Approved for entry into archive by 阎军(yanj@red.semi.ac.cn) on 2010-08-17T02:26:54Z (GMT) No. of bitstreams: 1 JApplPhys_108_013516.pdf: 259380 bytes, checksum: 164599214d7e14cadb24bf76f2dff61b (MD5)

Made available in DSpace on 2010-08-17T02:26:54Z (GMT). No. of bitstreams: 1 JApplPhys_108_013516.pdf: 259380 bytes, checksum: 164599214d7e14cadb24bf76f2dff61b (MD5) Previous issue date: 2010

We thank Dr. Yuefa Li to provide the samples. This work is supported by the 973 program (Grant Nos. 2006CB604908 and 2006CB921607), and the National Natural Science Foundation of China (Grant Nos. 60625402 and 60990313)

其它

We thank Dr. Yuefa Li to provide the samples. This work is supported by the 973 program (Grant Nos. 2006CB604908 and 2006CB921607), and the National Natural Science Foundation of China (Grant Nos. 60625402 and 60990313)

Identificador

http://ir.semi.ac.cn/handle/172111/13485

http://www.irgrid.ac.cn/handle/1471x/66253

Idioma(s)

英语

Fonte

Yu JL (Yu J. L.), Chen YH (Chen Y. H.), Ye XL (Ye X. L.), Jiang CY (Jiang C. Y.), Jia CH (Jia C. H.).In-plane optical anisotropy in GaAsN/GaAs single-quantum well investigated by reflectance-difference spectroscopy.JOURNAL OF APPLIED PHYSICS,2010,108(1):Art. No. 013516

Palavras-Chave #半导体材料 #MOLECULAR-BEAM EPITAXY #STRAIN RELAXATION #GROWTH TEMPERATURE #INTERFACE #ALLOYS #GAAS #HETEROSTRUCTURES #MICROSTRUCTURE #GANXAS1-X #NITROGEN
Tipo

期刊论文