Selective and lithography-independent fabrication of 20 nm nano-gap electrodes and nano-channels for nanoelectrofluidics applications


Autoria(s): Zhang JY; Wang XF; Wang XD; Fan ZC; Li Y; Ji A; Yang FH
Data(s)

2010

Resumo

A new method has been developed to selectively fabricate nano-gap electrodes and nano-channels by conventional lithography. Based on a sacrificial spacer process, we have successfully obtained sub-100-nm nano-gap electrodes and nano-channels and further reduced the dimensions to 20 nm by shrinking the sacrificial spacer size. Our method shows good selectivity between nano-gap electrodes and nano-channels due to different sacrificial spacer etch conditions. There is no length limit for the nano-gap electrode and the nano-channel. The method reported in this paper also allows for wafer scale fabrication, high throughput, low cost, and good compatibility with modern semiconductor technology.

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Submitted by 阎军 (yanj@red.semi.ac.cn) on 2010-04-05T08:06:42Z No. of bitstreams: 1 49.pdf: 674942 bytes, checksum: c387362417d1bd25fde3a6f1804b9e91 (MD5)

National High-tech Research and Development Program (863) 2008AA031402;National Natural Science Foundation of China 60606024

其它

National High-tech Research and Development Program (863) 2008AA031402;National Natural Science Foundation of China 60606024

Identificador

http://ir.semi.ac.cn/handle/172111/10217

http://www.irgrid.ac.cn/handle/1471x/66135

Idioma(s)

英语

Fonte

Zhang JY, Wang XF, Wang XD, Fan ZC, Li Y, Ji A, Yang FH.Selective and lithography-independent fabrication of 20 nm nano-gap electrodes and nano-channels for nanoelectrofluidics applications.NANOTECHNOLOGY,2010,21(7):Art. No. 075303

Palavras-Chave #微电子学 #FOCUSED-ION-BEAM
Tipo

期刊论文