Impact of diode facet reflectivity on the fiber grating external cavity semiconductor laser
| Data(s) |
2004
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| Resumo |
The scattering matrix method is used to analyze the multiple reflection effect between the laser diode facet and the fiber grating facet by considering the fiber grating external cavity laser diode (FGECL) as a four-mirror cavity laser. When neglecting other important parameters such as butt-coupling distance between the diode and the fiber facets, coupling efficiency, external cavity length, it is shown that low reflectivity is not a crucial factor for the laser characteristics such as SMSR. Experimentally high SMSR fiber grating external cavity laser is fabricated with a relatively large residual facet reflectivity (about 1%), which is coincident with our simulation results. The scattering matrix method is used to analyze the multiple reflection effect between the laser diode facet and the fiber grating facet by considering the fiber grating external cavity laser diode (FGECL) as a four-mirror cavity laser. When neglecting other important parameters such as butt-coupling distance between the diode and the fiber facets, coupling efficiency, external cavity length, it is shown that low reflectivity is not a crucial factor for the laser characteristics such as SMSR. Experimentally high SMSR fiber grating external cavity laser is fabricated with a relatively large residual facet reflectivity (about 1%), which is coincident with our simulation results. zhangdi于2010-03-29批量导入 zhangdi于2010-03-29批量导入 Chinese Phys Soc.; Shanghai Phys Soc.; Natl Nat Sci Fdn China.; E China Normal Univ, Sch Informat Sci & Technol.; Fudan Univ, Appl Surface Phys Lab.; Natl Lab Infrared Phys.; CAS, Shanghai Inst Tech Phys.; E China Normal Univ, Key Lab Opt & Magnet Resonance Spectroscopy. Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China Chinese Phys Soc.; Shanghai Phys Soc.; Natl Nat Sci Fdn China.; E China Normal Univ, Sch Informat Sci & Technol.; Fudan Univ, Appl Surface Phys Lab.; Natl Lab Infrared Phys.; CAS, Shanghai Inst Tech Phys.; E China Normal Univ, Key Lab Opt & Magnet Resonance Spectroscopy. |
| Identificador | |
| Idioma(s) |
英语 |
| Publicador |
SPIE-INT SOC OPTICAL ENGINEERING 1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA |
| Fonte |
Xu, QY; Chen, SW .Impact of diode facet reflectivity on the fiber grating external cavity semiconductor laser .见：SPIE-INT SOC OPTICAL ENGINEERING .FIFTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS丛书标题: PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE) ,1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA ,2004,5774: 519-522 |
| Palavras-Chave | #光电子学 #fiber grating |
| Tipo |
会议论文 |
