Defect influence on luminescence efficiency of GaN-based LEDs


Autoria(s): Li SP (Li Shuping); Fang ZL (Fang Zhilai); Chen HY (Chen Hangyang); Li JC (Li Jinchai); Chen XH (Chen Xiaohong); Yuan XL (Yuan Xiaoli); Sekiguchi T (Sekiguchi Takashi); Wang QM (Wang Qiming); Kang JY (Kang Junyong)
Data(s)

2006

Resumo

Wafers with normal light-emitting diode structure were grown by metal organic chemical vapor deposition system. The pressure and temperature were varied during growth of buffer layer in order to grow different types of epilayers. The cathodoluminescence results show that the interface distortion of quantum well plays an important role in radiant efficiency. The electroluminescence detections indicate that the dislocations also influence the external quantum efficiency by lowering the electron injection efficiency. (c) 2006 Elsevier Ltd. All rights reserved.

Wafers with normal light-emitting diode structure were grown by metal organic chemical vapor deposition system. The pressure and temperature were varied during growth of buffer layer in order to grow different types of epilayers. The cathodoluminescence results show that the interface distortion of quantum well plays an important role in radiant efficiency. The electroluminescence detections indicate that the dislocations also influence the external quantum efficiency by lowering the electron injection efficiency. (c) 2006 Elsevier Ltd. All rights reserved.

zhangdi于2010-03-29批量导入

zhangdi于2010-03-29批量导入

Xiamen Univ, Dept Phys, Xiamen 361005, Peoples R China; Xiamen Univ, Semicond Photon Res Ctr, Xiamen 361005, Peoples R China; Natl Inst Mat Sci, Tsukuba, Ibaraki, Japan; Chinese Acad Sci, Inst Semicond, Beijing 100864, Peoples R China

Identificador

http://ir.semi.ac.cn/handle/172111/10004

http://www.irgrid.ac.cn/handle/1471x/66003

Idioma(s)

英语

Publicador

ELSEVIER SCI LTD

THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND

Fonte

Li, SP (Li, Shuping); Fang, ZL (Fang, Zhilai); Chen, HY (Chen, Hangyang); Li, JC (Li, Jinchai); Chen, XH (Chen, Xiaohong); Yuan, XL (Yuan, Xiaoli); Sekiguchi, T (Sekiguchi, Takashi); Wang, QM (Wang, Qiming); Kang, JY (Kang, Junyong) .Defect influence on luminescence efficiency of GaN-based LEDs .见:ELSEVIER SCI LTD .MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND ,FEB-JUN 2006,9 (1-3): 371-374

Palavras-Chave #光电子学 #defects
Tipo

会议论文