Deep levels in high resistivity GaN epilayers grown by MOCVD


Autoria(s): Fang, CB; Wang, XL; Wang, JX; Liu, C; Wang, CM; Hu, GX; Li, JP; Li, CJ
Data(s)

2006

Resumo

Undoped high resistivity (HR) GaN epilayers were grown on (0001) sapphire substrate by metalorganic chemical vapor deposition (MOCVD). Thermally stimulated current (TSC) and resistivity measurements have been carried out to investigate deep level traps. Deep levels with activation energies of 1.06eV and 0.85eV were measured in sample 1. Gaussian fitting of TSC spectra showed five deep levels in different samples. (c) 2006 WILEY VCH Vertag GmbH & Co. KGaA, Weinheim

Undoped high resistivity (HR) GaN epilayers were grown on (0001) sapphire substrate by metalorganic chemical vapor deposition (MOCVD). Thermally stimulated current (TSC) and resistivity measurements have been carried out to investigate deep level traps. Deep levels with activation energies of 1.06eV and 0.85eV were measured in sample 1. Gaussian fitting of TSC spectra showed five deep levels in different samples. (c) 2006 WILEY VCH Vertag GmbH & Co. KGaA, Weinheim

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Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China

Identificador

http://ir.semi.ac.cn/handle/172111/9934

http://www.irgrid.ac.cn/handle/1471x/65968

Idioma(s)

英语

Publicador

WILEY-VCH, INC

605 THIRD AVE, NEW YORK, NY 10158-0012 USA

Fonte

Fang, CB; Wang, XL; Wang, JX; Liu, C; Wang, CM; Hu, GX; Li, JP; Li, CJ .Deep levels in high resistivity GaN epilayers grown by MOCVD .见:WILEY-VCH, INC .Physica Status Solidi C - Current Topics in Solid State Physics丛书标题: PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS ,605 THIRD AVE, NEW YORK, NY 10158-0012 USA ,2006,Vol 3 no 3 3 (3): 585-588

Palavras-Chave #半导体材料 #THERMALLY STIMULATED CURRENT #GALLIUM NITRIDE #DEFECTS
Tipo

会议论文