Growth Parameter Dependence of Structural Characterizations of Diluted Magnetic Semiconductor (Ga, Cr)As


Autoria(s): Lu J; Bi JF; Wang WZ; Gan HD; Meng HJ; Deng JJ; Zheng HZ; Zhao JH
Data(s)

15/10/2010

Resumo

We report the influence of growth parameters and post-growth annealing on the structural characterizations and magnetic properties of (Ga, Cr)As films. The crystalline quality and magnetic properties are sensitive to the growth conditions. The single-phase (Ga, Cr)As film with the Curie temperature of 10 K is synthesized at growth temperature T-s = 250 degrees C and with nominal Cr content x = 0.016. However, for the films with x > 0.02, the aggregation of Cr atoms is strongly enhanced as both T. and x increase, which not only brings strong compressive strain in the epilayer, but also roughens the surface. The origin of room-temperature ferromagnetism in (Ga, Cr)As films with nanoclusters is also discussed.

We report the influence of growth parameters and post-growth annealing on the structural characterizations and magnetic properties of (Ga, Cr)As films. The crystalline quality and magnetic properties are sensitive to the growth conditions. The single-phase (Ga, Cr)As film with the Curie temperature of 10 K is synthesized at growth temperature T-s = 250 degrees C and with nominal Cr content x = 0.016. However, for the films with x > 0.02, the aggregation of Cr atoms is strongly enhanced as both T. and x increase, which not only brings strong compressive strain in the epilayer, but also roughens the surface. The origin of room-temperature ferromagnetism in (Ga, Cr)As films with nanoclusters is also discussed.

zhangdi于2010-03-09批量导入

zhangdi于2010-03-09批量导入

[Lu, J.; Bi, J. F.; Wang, W. Z.; Gan, H. D.; Meng, H. J.; Deng, J. J.; Zheng, H. Z.; Zhao, J. H.] Chinese Acad Sci, Inst Semicond, State Key Lab Superlattices & Microstruct, Beijing 100083, Peoples R China

Identificador

http://ir.semi.ac.cn/handle/172111/8362

http://www.irgrid.ac.cn/handle/1471x/65880

Idioma(s)

英语

Publicador

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

445 HOES LANE, PISCATAWAY, NJ 08855 USA

Fonte

Lu, J;Bi, JF;Wang, WZ;Gan, HD;Meng, HJ;Deng, JJ;Zheng, HZ;Zhao, JH.Growth Parameter Dependence of Structural Characterizations of Diluted Magnetic Semiconductor (Ga, Cr)As .见:IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC .IEEE TRANSACTIONS ON MAGNETICS,445 HOES LANE, PISCATAWAY, NJ 08855 USA ,39753,44 (11): 2692-2695 Part 1 NOV

Palavras-Chave #半导体物理 #Magnetic analysis
Tipo

会议论文