Heteroepitaxial Growth of 3C-SiC on Si (111) Substrate using AlN as a Buffer Layer


Autoria(s): Zhao, YM; Sun, GS; Liu, XF; Li, JY; Zhao, WS; Wang, L; Li, JM; Zeng, YP
Data(s)

2009

Resumo

Using AlN as a buffer layer, 3C-SiC film has been grown on Si substrate by low pressure chemical vapor deposition (LPCVD). Firstly growth of AlN thin films on Si substrates under varied V/III ratios at 1100 degrees was investigated and the (002) preferred orientational growth with good crystallinity was obtained at the V/III ratio of 10000. Annealing at 1300 degrees C indicated the surface morphology and crystallinity stability of AlN film. Secondly the 3C-SiC film was grown on Si substrate with AlN buffer layer. Compared to that without AlN buffer layer, the crystal quality of the 3C-SiC film was improved on the AlN/Si substrate, characterized by X-ray diffraction (XRD) and Raman measurements.

Using AlN as a buffer layer, 3C-SiC film has been grown on Si substrate by low pressure chemical vapor deposition (LPCVD). Firstly growth of AlN thin films on Si substrates under varied V/III ratios at 1100 degrees was investigated and the (002) preferred orientational growth with good crystallinity was obtained at the V/III ratio of 10000. Annealing at 1300 degrees C indicated the surface morphology and crystallinity stability of AlN film. Secondly the 3C-SiC film was grown on Si substrate with AlN buffer layer. Compared to that without AlN buffer layer, the crystal quality of the 3C-SiC film was improved on the AlN/Si substrate, characterized by X-ray diffraction (XRD) and Raman measurements.

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Japan Soc Appl phys.; Assoc Promot Elect, Elect & Informat Engn.; Ceram Soc Japan.; IEEE EDS, Kansai Chapter.; IEEJ.; Inst Elect, Informat & Commun Engineers.; Japanese Assoc Crystal Growth.; Surface Sci Soc Japan.; Vacuum Soc Japan.

[Zhao, Y. M.; Sun, G. S.; Liu, X. F.; Li, J. Y.; Zhao, W. S.; Wang, L.; Li, J. M.; Zeng, Y. P.] Chinese Acad Sci, Inst Semicond, Novel Semicond Mat Lab, Beijing 100083, Peoples R China

Japan Soc Appl phys.; Assoc Promot Elect, Elect & Informat Engn.; Ceram Soc Japan.; IEEE EDS, Kansai Chapter.; IEEJ.; Inst Elect, Informat & Commun Engineers.; Japanese Assoc Crystal Growth.; Surface Sci Soc Japan.; Vacuum Soc Japan.

Identificador

http://ir.semi.ac.cn/handle/172111/8336

http://www.irgrid.ac.cn/handle/1471x/65867

Idioma(s)

英语

Publicador

TRANS TECH PUBLICATIONS LTD

LAUBLSRUTISTR 24, CH-8717 STAFA-ZURICH, SWITZERLAND

Fonte

Zhao, YM;Sun, GS;Liu, XF;Li, JY;Zhao, WS;Wang, L;Li, JM;Zeng, YP.Heteroepitaxial Growth of 3C-SiC on Si (111) Substrate using AlN as a Buffer Layer .见:TRANS TECH PUBLICATIONS LTD .SILICON CARBIDE AND RELATED MATERIALS 2007,LAUBLSRUTISTR 24, CH-8717 STAFA-ZURICH, SWITZERLAND ,2009,PTS 1 AND 2,600-603,: 251-254 Part 1-2

Palavras-Chave #半导体材料 #Silicon Carbide #Aluminum Nitride #buffer layer #LPCVD
Tipo

会议论文