Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406


Autoria(s): Liu, J; Zhang, SJ; Hu, YH; Xie, L; Huang, YZ; Zhu, NH
Data(s)

2008

Resumo

The measurement and analysis of the microwave frequency response of semiconductor optical amplifiers (SOAs) are proposed in this paper. The response is measured using a vector network analyzer. Then with the direct-subtracting method, which is based on the definition of scattering parameters of optoelectronic devices, the responses of both the optical signal source and the photodetector are eliminated, and the response of only the SOA is extracted. Some characteristics of the responses can be observed: the responses are quasi-highpass; the gain increases with the bias current; and the response becomes more gradient while the bias current is increasing. The multisectional model of an SOA is then used to analyze the response theoretically. By deducing from the carrier rate equation of one section under the steady state and the small-signal state, the expression of the frequency response is obtained. Then by iterating the expression, the response of the whole SOA is simulated. The simulated results are in good agreement with the measured on the three main characteristics, which are also explained by the deduced results. This proves the validity of the theoretical analysis.

The measurement and analysis of the microwave frequency response of semiconductor optical amplifiers (SOAs) are proposed in this paper. The response is measured using a vector network analyzer. Then with the direct-subtracting method, which is based on the definition of scattering parameters of optoelectronic devices, the responses of both the optical signal source and the photodetector are eliminated, and the response of only the SOA is extracted. Some characteristics of the responses can be observed: the responses are quasi-highpass; the gain increases with the bias current; and the response becomes more gradient while the bias current is increasing. The multisectional model of an SOA is then used to analyze the response theoretically. By deducing from the carrier rate equation of one section under the steady state and the small-signal state, the expression of the frequency response is obtained. Then by iterating the expression, the response of the whole SOA is simulated. The simulated results are in good agreement with the measured on the three main characteristics, which are also explained by the deduced results. This proves the validity of the theoretical analysis.

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SPIE.; Chinese Opt Soc.

[Liu, Jian; Hu, Yong-Hong; Xie, Liang; Huang, Yong-Zhen; Zhu, Ning-Hua] Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China

SPIE.; Chinese Opt Soc.

Identificador

http://ir.semi.ac.cn/handle/172111/7852

http://www.irgrid.ac.cn/handle/1471x/65751

Idioma(s)

英语

Publicador

SPIE-INT SOC OPTICAL ENGINEERING

1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA

Fonte

Liu, J ; Zhang, SJ ; Hu, YH ; Xie, L ; Huang, YZ ; Zhu, NH .Measurement and analysis of microwave frequency response of semiconductor optical amplifiers - art. no. 682406 .见:SPIE-INT SOC OPTICAL ENGINEERING .SEMICONDUCTOR LASERS AND APPLICATIONS III,1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA ,2008,6824: 82406-82406

Palavras-Chave #光电子学 #semiconductor optical amplifier #microwave frequency response #direct-subtracting method #vector network analyzer #multisectional model #rate equation #steady state #small-signal state
Tipo

会议论文