Accurate vibration detection of a rough surface - art. no. 683118


Autoria(s): Zeng, HL; Zhou, Y; Fan, ST; He, J
Data(s)

2008

Resumo

Based on the semiconductor laser whose spectral line with width is compressed to be less than 1.2Mhz, a system was designed to measure and improve the amplitude and frequency of the real-time microvibration with sinusoidal modulation. real-time microvibration measurement was executed without alignment problem in the interferometry; and low-frequency disturbance of environment could be eliminated. Suggestions were also given to consummate the system. The system also has resistance against the low frequency disturbance of the environment.

Based on the semiconductor laser whose spectral line with width is compressed to be less than 1.2Mhz, a system was designed to measure and improve the amplitude and frequency of the real-time microvibration with sinusoidal modulation. real-time microvibration measurement was executed without alignment problem in the interferometry; and low-frequency disturbance of environment could be eliminated. Suggestions were also given to consummate the system. The system also has resistance against the low frequency disturbance of the environment.

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SPIE.; Chinese Opt Soc.

[Zeng, Hualin; Zhou, Yan; Fan, Songtao; He, Jun] Chinese Acad Sci, Inst Semicond, Beijing 100864, Peoples R China

SPIE.; Chinese Opt Soc.

Identificador

http://ir.semi.ac.cn/handle/172111/7808

http://www.irgrid.ac.cn/handle/1471x/65707

Idioma(s)

英语

Publicador

SPIE-INT SOC OPTICAL ENGINEERING

1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA

Fonte

Zeng, HL ; Zhou, Y ; Fan, ST ; He, J .Accurate vibration detection of a rough surface - art. no. 683118 .见:SPIE-INT SOC OPTICAL ENGINEERING .NANOPHOTONICS,NANOSTRUCTURE,AND NANOMETROLOGY II,1000 20TH ST, PO BOX 10, BELLINGHAM, WA 98227-0010 USA ,2008,6831: 83118-83118

Palavras-Chave #光电子学 #measurement of microvibration #nanometrology #interferometry #vibration detection
Tipo

会议论文