Stability improvement of selective oxidation during the fabrication of InGaAs/GaAs vertical cavity surface emitting laser


Autoria(s): Pan Z; Zhang Y; Du Y; Wu RH
Data(s)

1998

Resumo

The effects of the carrier gas flow and water temperature on the oxidation rate for different reaction temperatures were investigated. The optimum conditions for stable oxidation were obtained. Two mechanisms of the oxidation process are revealed. One is the flow-controlling process, which is unstable. The other is the temperature-controlling process, which is stable. The stable region decreases for higher reaction temperatures. The simulation results for the stable oxidation region are also given. With optimum oxidation conditions, the stability and precision of the oxidation can be dramatically improved.

Identificador

http://ir.semi.ac.cn/handle/172111/13162

http://www.irgrid.ac.cn/handle/1471x/65551

Idioma(s)

英语

Fonte

Pan Z; Zhang Y; Du Y; Wu RH .Stability improvement of selective oxidation during the fabrication of InGaAs/GaAs vertical cavity surface emitting laser ,JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,1998,37(6B):3673-3675

Palavras-Chave #半导体物理 #VCSEL #selective oxidation #stability #MICROSTRUCTURE #WET OXIDATION
Tipo

期刊论文