p-type co-doping study of GaN by photoluminescence


Autoria(s): Zhang JP; Sun DZ; Wang XL; Kong MY; Zeng YP; Li JM; Lin LY
Data(s)

1999

Resumo

Photoluminescence measurements were performed on p-type co-doping effects of C, As, and Mg in GaN. The dopants were incorporated into GaN by ion implantation performed at 77 K. We find that the 3.42 eV luminescence line is sensitive to hole concentration, and propose that after cartful calibration the 3.42 eV line may be used as a probe to measure hole concentration in GaN. Simply doping one kind of accepters will not result in holes, while co-doping can substantially improve p-type doping efficiency. As + C and As + Mg co-doping induce an acceptor level of 180 meV above the valence band. Mg + C co-doping is the most promising method for p-type doping, the related acceptor level is determined to be as shallow as 130 meV. The improvement of the doping efficiency by co-doping is probably due to the decrease of the acceptor ionization energy. (C) 1999 Elsevier Science B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/13000

http://www.irgrid.ac.cn/handle/1471x/65470

Idioma(s)

英语

Fonte

Zhang JP; Sun DZ; Wang XL; Kong MY; Zeng YP; Li JM; Lin LY .p-type co-doping study of GaN by photoluminescence ,JOURNAL OF CRYSTAL GROWTH ,1999,197(1-2):368-371

Palavras-Chave #半导体材料 #p-type co-doping #photoluminescence #acceptor ionization energy #IMPLANTED GAN #TRANSITIONS #ENERGY #GALLIUM NITRIDE
Tipo

期刊论文