High-frequency hydrogen-related infrared modes in silicon grown in a hydrogen atmosphere


Autoria(s): Pajot B; Clerjaud B; Xu ZJ
Data(s)

1999

Resumo

High-frequency vibrational modes have been observed at liquid-helium temperature in silicon samples grown in a H-2 or D-2 atmosphere. The highest-frequency ones are due to the overtones and combination modes of SiH fundamentals. Others are CH modes due to (C,H) complexes, but the simultaneous presence of NH modes due to (N,H) complexes cannot be excluded. The present results seem to show also the existence of centers including both SiH and CH or NH bonds. One sharp mode at 4349 cm-l is related to a weak SiH fundamental at 2210 cm(-1). The related center is ascribed to a vacancy fully decorated with hydrogen with a nearest-neighbor C atom. [S0163-1829(99)00911-X].

Identificador

http://ir.semi.ac.cn/handle/172111/12958

http://www.irgrid.ac.cn/handle/1471x/65449

Idioma(s)

英语

Fonte

Pajot B; Clerjaud B; Xu ZJ .High-frequency hydrogen-related infrared modes in silicon grown in a hydrogen atmosphere ,PHYSICAL REVIEW B,1999,59(11):7500-7506

Palavras-Chave #半导体物理 #ION-IMPLANTED SILICON #UNIAXIAL-STRESS #ABSORPTION #NITROGEN #DEFECT #GERMANIUM #COMPLEXES #OXYGEN #LEVEL #BANDS
Tipo

期刊论文