Photoluminescence study on coarsening of self-assembled InAlAs quantum dots on GaAs (001)


Autoria(s): Zhou W; Xu B; Xu HZ; Liu FQ; Liang JB; Wang ZG; Zhu ZZ; Li GH
Data(s)

1999

Resumo

Red-emission at similar to 640 nm from self-assembled In0.55Al0.45As/Al0.5Ga0.5As quantum dots grown on GaAs substrate by molecular beam epitaxy (MBE) has been demonstrated. We obtained a double-peak structure of photoluminescence (PL) spectra from quantum dots. An atomic force micrograph (AFM) image for uncapped sample also shows a bimodal distribution of dot sizes. From the temperature and excitation intensity dependence of PL spectra, we found that the double-peak structure of PL spectra from quantum dots was strongly correlated to the two predominant quantum dot families. Taking into account quantum-size effect on the peak energy, we propose that the high (low) energy peak results from a smaller (larger) dot family, and this result is identical with the statistical distribution of dot lateral size from the AFM image.

Identificador

http://ir.semi.ac.cn/handle/172111/12914

http://www.irgrid.ac.cn/handle/1471x/65427

Idioma(s)

英语

Fonte

Zhou W; Xu B; Xu HZ; Liu FQ; Liang JB; Wang ZG; Zhu ZZ; Li GH .Photoluminescence study on coarsening of self-assembled InAlAs quantum dots on GaAs (001) ,JOURNAL OF ELECTRONIC MATERIALS ,1999,28(5):528-531

Palavras-Chave #半导体材料 #bimodal distribution #photoluminescence (PL) #quantum-size effect #ENSEMBLES #SI(100) #GROWTH #SHAPE #GE
Tipo

期刊论文