Compensation ratio-dependent concentration of a VInH4 complex in n-type liquid encapsulated Czochralski InP


Autoria(s): Fung S; Zhao YW; Beling CD; Xu XL; Gong M; Sun NF; Sun TN; Chen XD; Zhang RG; Liu SL; Yang GY; Qian JJ; Sun MF; Liu XL
Data(s)

1998

Resumo

The concentration of hydroen-indium vacancy complex VInH4 in liquid encapsulated Czochralski undoped and Fe-doped n-type InP has been studied by low-temperature infrared absorption spectroscopy. The VInH4 complex is found to be a dominant intrinsic shallow donor defect with concentrations up to similar to 10(16) cm(-3) in as-grown liquid encapsulated Czochralski InP. The concentration of the VInH4 complex is found to increase with the compensation ratio in good agreement with the proposed defect formation model of Walukiewicz [W. Walukiewicz, Phys. Rev. B 37, 4760 (1998); Appl. Phys. Lett. 54, 2094 (1989)], which predicts a Fermi-level-dependent concentration of amphoteric defects. (C) 1998 American Institute of Physics, [S0003-6951(98)04435-0].

Identificador

http://ir.semi.ac.cn/handle/172111/12768

http://www.irgrid.ac.cn/handle/1471x/65354

Idioma(s)

英语

Fonte

Fung S; Zhao YW; Beling CD; Xu XL; Gong M; Sun NF; Sun TN; Chen XD; Zhang RG; Liu SL; Yang GY; Qian JJ; Sun MF; Liu XL .Compensation ratio-dependent concentration of a VInH4 complex in n-type liquid encapsulated Czochralski InP ,APPLIED PHYSICS LETTERS,1998,73(9):1275-1277

Palavras-Chave #半导体物理 #SEMICONDUCTORS #HYDROGEN #DEFECTS #MECHANISM
Tipo

期刊论文