Polishing-related optical anisotropy of semi-insulating GaAs studied by reflectance difference spectroscopy


Autoria(s): Chen YH; Wang ZG; Qian JJ; Yang Z
Data(s)

2000

Resumo

The strong in-plane optical anisotropy of (001) semi-insulating GaAs, which comes from the submicron region under the surface, has been observed by reflectance difference spectroscopy. The optical anisotropy can be explained by the anisotropic strain that is introduced by the asymmetric distribution of 60 degrees dislocations during surface polishing. The simulated spectra reproduce the line shape of the experimental ones. The simulations show that the anisotropic strain is typically about 2.3x10(-4). (C) 2000 American Institute of Physics. [S0021-8979(00)01315-3].

Identificador

http://ir.semi.ac.cn/handle/172111/12510

http://www.irgrid.ac.cn/handle/1471x/65225

Idioma(s)

英语

Fonte

Chen YH; Wang ZG; Qian JJ; Yang Z .Polishing-related optical anisotropy of semi-insulating GaAs studied by reflectance difference spectroscopy ,JOURNAL OF APPLIED PHYSICS,2000,88(3):1695-1697

Palavras-Chave #半导体物理 #GROWTH
Tipo

期刊论文