Elastic deformation of wafer surfaces in bonding


Autoria(s): Han WH; Yu JZ; Wang QM
Data(s)

2000

Resumo

A model has been proposed for describing elastic deformation of wafer surfaces in bonding. The change of the surface shape is studied on the basis of the distribution of the periodic strain field. With the condition of diminishing periodic strain away from the interface, Airy stress function has been found that satisfies the elastic mechanical equilibrium. The result reveals that the wavy interface elastically deforms a spatial wavelength from the interface. (C) 2000 American Institute of Physics. [S0021-8979(00)04219-5].

Identificador

http://ir.semi.ac.cn/handle/172111/12446

http://www.irgrid.ac.cn/handle/1471x/65193

Idioma(s)

英语

Fonte

Han WH; Yu JZ; Wang QM .Elastic deformation of wafer surfaces in bonding ,JOURNAL OF APPLIED PHYSICS,2000,88(7):4401-4403

Palavras-Chave #半导体物理
Tipo

期刊论文