Point defects in III-V compound semiconductors
Data(s) |
2000
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Resumo |
Point defects in III-V compound semiconductors were analyzed systematically in this paper. The effects of substitutes, antisites, interstitials, and vacancies on lattice parameters in III-V compound semiconductors were calculated with a simple model. The formation energies of vacancies in compound semiconductors can be obtained by this calculation. A practical technique established on this model has been utilized for measuring the stoichiometry in GaAs. The relationship between stoichiometry and deep level centers in GaAs was also investigated. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Chen N .Point defects in III-V compound semiconductors ,DEFECTS AND DIFFUSION IN SEMICONDUCTORS,2000,183-1(0 ):85-93 |
Palavras-Chave | #半导体材料 #compound semiconductors #point defects #deep level centres #stoichiometry #MOLECULAR-BEAM EPITAXY #GAAS SINGLE-CRYSTALS #SEMIINSULATING GALLIUM-ARSENIDE #SEMI-INSULATING GAAS #ELECTRICAL-PROPERTIES #LATTICE-PARAMETER #NATIVE DEFECTS #CARBON #DIFFRACTOMETER #STOICHIOMETRY |
Tipo |
期刊论文 |