Changing the size and shape of Ge island by chemical etching


Autoria(s): Gao F; Huang CJ; Huang DD; Li JP; Sun DZ; Kong MY; Zeng YP; Li JM; Lin LY
Data(s)

2001

Resumo

Self-assembled Ge islands were grown on Si (1 0 0) substrate by Si2H6-Ge molecular beam epitaxy. Subjected to a chemical etching, it is found that the size and shape (i.e. ratio of height to base width) of Ge islands change with etching time. In addition, the photoluminescence from the etched Ge islands shifted to the higher energy side compared to that of the as-deposited Ge islands. Our results demonstrated that chemical etching can be a way to change the size and shape of the as-deposited islands as well as their luminescence property. (C) 2001 Elsevier Science B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/12128

http://www.irgrid.ac.cn/handle/1471x/65034

Idioma(s)

英语

Fonte

Gao F; Huang CJ; Huang DD; Li JP; Sun DZ; Kong MY; Zeng YP; Li JM; Lin LY .Changing the size and shape of Ge island by chemical etching ,JOURNAL OF CRYSTAL GROWTH,2001 ,231(1-2):17-21

Palavras-Chave #半导体材料 #atomic force microscopy #etching #nanostructures #molecular beam epitaxy #semiconducting germanium #semiconducting silicon #QUANTUM DOTS #INAS #GROWTH #STRAIN
Tipo

期刊论文