Photoluminescence of AlGaAs/InGaAs/GaAs pseudomorphic HEMTs with different thickness of spacer layer


Autoria(s): Cao X; Zeng YP; Kong MY; Pan LA; Wang BQ; Zhu ZP; Wang XG; Chang Y; Chu JH
Data(s)

2001

Resumo

The photoluminescence spectra of the single delta -doped AlGaAs/InGaAs/GaAs pseudomorphic HEMTs with different thickness of spacer layer were studied. There are two peaks in the PL spectra of the structure corresponding to two sub-energy levels of the InGaAs quantum well. It was found that the photoluminescence intensity ratio of the two peaks changes with the spacer thickness of the pseudomorphic HEMTs. The reasons were discussed. The possible use of this phenomenon in optimization of pseudomorphic HEMTs was also proposed. (C) 2001 Elsevier Science B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/12098

http://www.irgrid.ac.cn/handle/1471x/65019

Idioma(s)

英语

Fonte

Cao X; Zeng YP; Kong MY; Pan LA; Wang BQ; Zhu ZP; Wang XG; Chang Y; Chu JH .Photoluminescence of AlGaAs/InGaAs/GaAs pseudomorphic HEMTs with different thickness of spacer layer ,JOURNAL OF CRYSTAL GROWTH,2001 ,231(4):520-524

Palavras-Chave #半导体材料 #molecular beam epitaxy #semiconducting III-V materials #high electron mobility transistors #ELECTRON-MOBILITY TRANSISTOR #CARRIER DENSITY #QUANTUM-WELLS #BAND-GAP
Tipo

期刊论文