Surface acoustic wave velocity and electromechanical coupling coefficient of GaN grown on (0001) sapphire by metal-organic vapour phase epitaxy


Autoria(s): Chen Z; Lu DC; Wang XH; Liu XL; Han PD; Yuan HR; Wang D; Wang ZG; He ST; Li HL; Yan L; Chen XY
Data(s)

2001

Resumo

High-quality and high-resistivity GaN films were grown on (0001) sapphire face by metal-organic vapour phase epitaxy. To measure the surface acoustic wave properties accurately, we deposited metallized interdigital transducers on the GaN surface. The acoustic surface wave velocity and electromechanical coupling coefficient were measured, respectively, to be 5667 m/s and 1.9% by the pulse method.

Identificador

http://ir.semi.ac.cn/handle/172111/12064

http://www.irgrid.ac.cn/handle/1471x/65002

Idioma(s)

英语

Fonte

Chen Z; Lu DC; Wang XH; Liu XL; Han PD; Yuan HR; Wang D; Wang ZG; He ST; Li HL; Yan L; Chen XY .Surface acoustic wave velocity and electromechanical coupling coefficient of GaN grown on (0001) sapphire by metal-organic vapour phase epitaxy ,CHINESE PHYSICS LETTERS,2001 ,18(10):1418-1419

Palavras-Chave #半导体物理 #THIN-FILMS #DEPOSITION #DIODES
Tipo

期刊论文