Excitonic photoluminescence properties of nanocrystalline GaSb and Ga0.62In0.38Sb embedded in silica films


Autoria(s): Liu FM; Wang TM; Zhang LD; Li GH; Han HX
Data(s)

2002

Resumo

The GaSb and Ga0.62In0.38Sb nanocrystals were embedded in the SiO2 films by radio-frequency magnetron co-sputtering and were grown on GaSb and Si substrates at different temperatures. We present results on the 10K excitonic photoluminescence (PL) properties of nanocrystalline GaSb and Ga0.62In0.38Sb as a function of their size. The measurements show that the PL of the GaSb and Ga0.62In0.38Sb nanocrystallites follows the quantum confinement model very closely. By using deconvolution of PL spectra, origins of structures in PL were identified. (C) 2002 Elsevier Science B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/11752

http://www.irgrid.ac.cn/handle/1471x/64846

Idioma(s)

英语

Fonte

Liu FM; Wang TM; Zhang LD; Li GH; Han HX .Excitonic photoluminescence properties of nanocrystalline GaSb and Ga0.62In0.38Sb embedded in silica films ,JOURNAL OF LUMINESCENCE,2002,99 (3):273-281

Palavras-Chave #光电子学 #nanocrystals #photoluminescence #quantum confinement #GaSb #Ga0.62In0.38Sb #LIQUID-PHASE EPITAXY #X-RAY PHOTOELECTRON #GALLIUM ANTIMONIDE #COMPOSITE FILMS #QUANTUM DOTS #RAMAN #SPECTROSCOPY #DEPOSITION #SPECTRA #MATRIX
Tipo

期刊论文