In0.25Ga0.75As growth on low-temperature thin buffer layers formed on GaAs (001) substrate


Autoria(s): Zhang ZC; Yang SY; Zhang FQ; Xu B; Zeng YP; Chen YH; Wang ZG
Data(s)

2003

Resumo

High-quality In0.25Ga0.75As films were grown on low-temperature (LT) ultra-thin GaAs buffer layers formed on GaAs (0 0 1) substrate by molecular beam epitaxy. The epilayers were studied by atomic force microscopy (AFM), photo luminescence (PL) and double crystal X-ray diffraction (DCXRD), All the measurements indicated that LT thin buffer layer technique is a simple but powerful growth technique for heteroepitaxy. (C) 2002 Elsevier Science B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/11690

http://www.irgrid.ac.cn/handle/1471x/64815

Idioma(s)

英语

Fonte

Zhang ZC; Yang SY; Zhang FQ; Xu B; Zeng YP; Chen YH; Wang ZG .In0.25Ga0.75As growth on low-temperature thin buffer layers formed on GaAs (001) substrate ,JOURNAL OF CRYSTAL GROWTH,2003 ,247 (1-2):126-130

Palavras-Chave #半导体材料 #dislocation #interfaces #strain #molecular beam epitaxy #semiconductor IIIV materials #MOLECULAR-BEAM EPITAXY #SURFACE-MORPHOLOGY #TECHNOLOGY #GAAS(001) #BEHAVIOR #SI
Tipo

期刊论文