Frequency limitation in the calibration of microwave test fixtures


Autoria(s): Zhu NH; Qian C; Wang YL; Pun EYB; Chung PS
Data(s)

2003

Resumo

The problem of frequency limitation arising from the calibration of asymmetric and symmetric test fixtures has been investigated. For asymmetric test fixtures, a new algorithm based on the thru-short-match (TSM) method is outlined. It is found that the conventional TSM method does not have any inherent frequency limitation, but using the same procedure with an unknown match may lead to the said problem. This limitation can be avoided by using a different algorithm. The various calibration methods for symmetric test fixtures using known standards are also discussed and the origin of the frequency limitation is identified. Several ways in avoiding the problem are proposed. There is good agreement between the theories and experimental data.

Identificador

http://ir.semi.ac.cn/handle/172111/11474

http://www.irgrid.ac.cn/handle/1471x/64707

Idioma(s)

英语

Fonte

Zhu NH; Qian C; Wang YL; Pun EYB; Chung PS .Frequency limitation in the calibration of microwave test fixtures ,IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES,2003,51 (9):2000-2006

Palavras-Chave #光电子学 #calibration #deembedding #microwave network analyzer #scattering parameter measurement #test fixture #NETWORK-ANALYZER CALIBRATION
Tipo

期刊论文