Capacitance-voltage spectroscopy of In0.5Ga0.5As self-assembled quantum dots in double quantum wells under selective photo-excitation


Autoria(s): Li GR; Zheng HZ; Yang FH; Hu CY
Data(s)

2003

Resumo

Selectively photo-excited C-V spectroscopy has been measured in an In0.5Ga0.5As quantum dots (QDs)-embedded, three barrier-two well heterostructure. By comparing with a theoretical capacitance model, the pure capacitive contribution from In0.5Ga0.5As QDs, due to tunnelling coupling between In0.5Ga0.5As QDs and In0.18Ga0.82As quantum well, has been used to obtain the density of charges from photo-excited In0.5Ga0.5As QDs in a very straightforward manner.

Identificador

http://ir.semi.ac.cn/handle/172111/11464

http://www.irgrid.ac.cn/handle/1471x/64702

Idioma(s)

英语

Fonte

Li GR; Zheng HZ; Yang FH; Hu CY .Capacitance-voltage spectroscopy of In0.5Ga0.5As self-assembled quantum dots in double quantum wells under selective photo-excitation ,SEMICONDUCTOR SCIENCE AND TECHNOLOGY,2003 ,18 (8):760-762

Palavras-Chave #半导体材料 #PHOTOLUMINESCENCE #EMISSION #STATES
Tipo

期刊论文