Electronic properties of sulfur passivated undoped-n(+) type GaAs surface studied by photoreflectance


Autoria(s): Jin P; Pan SH; Li YG; Zhang CZ; Wang ZG
Data(s)

2003

Resumo

Photoreflectance (PR) has been used to study surface electronic properties (electric field, Fermi level pinning, and density of surface states) of undoped-n(+) (UN+) GaAs treated in the solution of ammonium sulfide in isopropanol. Complex Fourier transformation (CFT) of PR spectra from passivated surface shows that the sulfur overlay on GaAs surface makes no contribution to Franz-Keldysh oscillations (FKOs). The barrier height measured by PR is derived from surface states directly, rather than the total barrier height, which includes the potentials derived from Ga-S and As-S dipole layers. Comparing with native oxidated surface, the passivation leads to 80 meV movement of surface Fermi level towards the conduction band minimum, and reduction by more than one order in density of surface states. (C) 2003 Elsevier Science B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/11452

http://www.irgrid.ac.cn/handle/1471x/64696

Idioma(s)

英语

Fonte

Jin P; Pan SH; Li YG; Zhang CZ; Wang ZG .Electronic properties of sulfur passivated undoped-n(+) type GaAs surface studied by photoreflectance ,APPLIED SURFACE SCIENCE,2003 ,218 (1-4):210-214

Palavras-Chave #半导体材料 #sulfur passivation #Franz-Keldysh oscillations #undoped-n(+) type GaAs #complex Fourier transformation #FRANZ-KELDYSH OSCILLATIONS #GAAS(001) SURFACES #GAAS(100) #PHOTOEMISSION #SPECTROSCOPY #ENHANCEMENT
Tipo

期刊论文