Mutual passivation of donors and isovalent nitrogen in GaAs
Data(s) |
2006
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Resumo |
We study the mutual passivation of shallow donor and isovalent N in GaAs. We find that all the donor impurities, Si-Ga, Ge-Ga, S-As, and Se-As, bind to N in GaAsN, which has a large N-induced band-gap reduction relative to GaAs. For a group-IV impurity such as Si, the formation of the nearest-neighbor Si-Ga-N-As defect complex creates a deep donor level below the conduction band minimum (CBM). The coupling between this defect level with the CBM pushes the CBM upwards, thus restoring the GaAs band gap; the lowering of the defect level relative to the isolated Si-Ga shallow donor level is responsible for the increased electrical resistivity. Therefore, Si and N mutually passivate each other's electrical and optical activities in GaAs. For a group-VI shallow donor such as S, the binding between S-As and N-As does not form a direct bond; therefore, no mutual passivation exists in the GaAs(S+N) system. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Li J; Carrier P; Wei SH; Li SS; Xia JB .Mutual passivation of donors and isovalent nitrogen in GaAs ,PHYSICAL REVIEW LETTERS,2006,96(3):Art.No.035505 |
Palavras-Chave | #半导体物理 #DILUTED GANXAS1-X ALLOYS #GROUP-IV DONORS #SEMICONDUCTOR ALLOYS #OPTICAL-PROPERTIES #BAND #GAN(X)AS1-X #IMPURITIES #HYDROGEN |
Tipo |
期刊论文 |