Mutual passivation of donors and isovalent nitrogen in GaAs


Autoria(s): Li J; Carrier P; Wei SH; Li SS; Xia JB
Data(s)

2006

Resumo

We study the mutual passivation of shallow donor and isovalent N in GaAs. We find that all the donor impurities, Si-Ga, Ge-Ga, S-As, and Se-As, bind to N in GaAsN, which has a large N-induced band-gap reduction relative to GaAs. For a group-IV impurity such as Si, the formation of the nearest-neighbor Si-Ga-N-As defect complex creates a deep donor level below the conduction band minimum (CBM). The coupling between this defect level with the CBM pushes the CBM upwards, thus restoring the GaAs band gap; the lowering of the defect level relative to the isolated Si-Ga shallow donor level is responsible for the increased electrical resistivity. Therefore, Si and N mutually passivate each other's electrical and optical activities in GaAs. For a group-VI shallow donor such as S, the binding between S-As and N-As does not form a direct bond; therefore, no mutual passivation exists in the GaAs(S+N) system.

Identificador

http://ir.semi.ac.cn/handle/172111/10870

http://www.irgrid.ac.cn/handle/1471x/64631

Idioma(s)

英语

Fonte

Li J; Carrier P; Wei SH; Li SS; Xia JB .Mutual passivation of donors and isovalent nitrogen in GaAs ,PHYSICAL REVIEW LETTERS,2006,96(3):Art.No.035505

Palavras-Chave #半导体物理 #DILUTED GANXAS1-X ALLOYS #GROUP-IV DONORS #SEMICONDUCTOR ALLOYS #OPTICAL-PROPERTIES #BAND #GAN(X)AS1-X #IMPURITIES #HYDROGEN
Tipo

期刊论文