Optical anisotropy and strain evolution of GaAs surfaces at the onset of the formation of InAs quantum dots


Autoria(s): Chen YH; Jin P; Ye XL; Xu B; Wang ZG; Yang Z
Data(s)

2006

Resumo

By using reflectance difference spectroscopy we have studied the in-plane optical anisotropy of GaAs surfaces covered by ultrathin InAs layers. The strain evolution of the GaAs surface with the InAs deposition thickness can be obtained. It is found that the optical anisotropy and the surface tensile strain attain maximum values at the onset of the formation of InAs quantum dots (QDs) and then decrease rapidly as more InAs QDs are formed with the increase of InAs deposition. The origin of the optical anisotropy has been discussed.

Identificador

http://ir.semi.ac.cn/handle/172111/10716

http://www.irgrid.ac.cn/handle/1471x/64554

Idioma(s)

英语

Fonte

Chen YH; Jin P; Ye XL; Xu B; Wang ZG; Yang Z .Optical anisotropy and strain evolution of GaAs surfaces at the onset of the formation of InAs quantum dots ,JOURNAL OF APPLIED PHYSICS,2006,99(7):Art.No.073507

Palavras-Chave #半导体材料 #REFLECTANCE DIFFERENCE SPECTROSCOPY #LAYER
Tipo

期刊论文