Lifetime study of N impurity states in GaAs1-xNx (x=0.1%) under hydrostatic pressure


Autoria(s): Wang WJ; Yang XD; Ma BS; Sun Z; Su FH; Ding K; Xu ZY; Li GH; Zhang Y; Mascarenhas A; Xin HP; Tu CW
Data(s)

2006

Resumo

The lifetimes of a series of N-related photoluminescence lines (A(2)-A(6)) in GaAs1-xNx (x=0.1%) were studied under hydrostatic pressures at similar to 30 K. The lifetimes of A(5) and A(6) were found to increase rapidly with increasing pressure: from 2.1 ns at 0 GPa to more than 20 ns at 0.92 GPa for A(5) and from 3.2 ns at 0.63 GPa to 10.8 ns at 0.92 GPa for A(6). The lifetime is found to be closely correlated with the binding energy of the N impurity states, which is shown either in the pressure dependence for a given emission line or in the lifetime variation from A(2) to A(6). (c) 2006 American Institute of Physics.

Identificador

http://ir.semi.ac.cn/handle/172111/10666

http://www.irgrid.ac.cn/handle/1471x/64529

Idioma(s)

英语

Fonte

Wang WJ; Yang XD; Ma BS; Sun Z; Su FH; Ding K; Xu ZY; Li GH; Zhang Y; Mascarenhas A; Xin HP; Tu CW .Lifetime study of N impurity states in GaAs1-xNx (x=0.1%) under hydrostatic pressure ,APPLIED PHYSICS LETTERS,2006,88(20):Art.No.201917

Palavras-Chave #半导体物理 #PAIR LUMINESCENCE #GAP-N #GAAS #EXCITONS #ALLOY
Tipo

期刊论文