Raman scattering study on vibrational modes in Ga1-xMnxN prepared by Mn-ion implantation


Autoria(s): Islam MR (Islam M. R.); Chen NF (Chen N. F.); Yamada M (Yamada M.)
Data(s)

2006

Resumo

Raman scattering measurements have been carried out on ferromagnetic semiconductor Ga1-xMnxN prepared by Mn-ion implantation and post annealing. The Raman results obtained from the annealed and un-annealed Ga1-xMnxN demonstrate that crystalline quality has been improved in Ga1-xMnxN after annealing. Some new vibrational modes in addition to GaN-like modes are found in the Raman spectra measured from the Ga1-xMnxN where the GaN-like modes are found to be shifted in the higher frequency side than those measured from the bulk GaN. A new vibrational mode observed is assigned to MnN-like mode. Other new phonon modes observed are assigned to disorder-activated modes and Mn-related vibrational modes caused by Mn-ion implantation and post-annealing. (c) 2006 Elsevier Ltd. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/10536

http://www.irgrid.ac.cn/handle/1471x/64464

Idioma(s)

英语

Fonte

Islam MR (Islam M. R.); Chen NF (Chen N. F.); Yamada M (Yamada M.) .Raman scattering study on vibrational modes in Ga1-xMnxN prepared by Mn-ion implantation ,MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING,2006 ,9(1-3):184-187

Palavras-Chave #半导体材料 #Raman scattering #ferromagnetic semiconductor GaMnN #ion implantation #GROWTH #GAN
Tipo

期刊论文