Theoretical analysis about the influence of channel layer thickness on the 2D electron gas and its distribution in InP-based high-electron-mobility transistors


Autoria(s): Li DL (Li Dong-Lin); Zeng YP (Zeng Yi-Ping)
Data(s)

2006

Resumo

The principle of high-electron-mobility transistor (HEMT) and the property of two-dimensional electron gas (2DEG) have been analyzed theoretically. The concentration and distribution of 2DEG in various channel layers are calculated by numerical method. Variation of 2DEG concentration in different subband of the quantum well is discussed in detail. Calculated results show that sheet electron concentration of 2DEG in the channel is affected slightly by the thickness of the channel. But the proportion of electrons inhabited in different subbands can be affected by the thickness of the channel. When the size of channel lies between 20-25 nm, the number of electrons occupying the second subband reaches the maximum. This result can be used in parameter design of materials and devices.

Identificador

http://ir.semi.ac.cn/handle/172111/10524

http://www.irgrid.ac.cn/handle/1471x/64458

Idioma(s)

中文

Fonte

Li DL (Li Dong-Lin); Zeng YP (Zeng Yi-Ping) .Theoretical analysis about the influence of channel layer thickness on the 2D electron gas and its distribution in InP-based high-electron-mobility transistors ,ACTA PHYSICA SINICA,2006,55(7):3677-3682

Palavras-Chave #半导体材料 #HEMT #heterojunction #two dimentional electron gas #self-consistent calculation #FIELD-EFFECT TRANSISTOR #TRANSPORT-PROPERTIES #QUANTUM-WELLS #HEMTS #FREQUENCY #DENSITY
Tipo

期刊论文