Shrinkage of nanocavities in silicon during electron beam irradiation


Autoria(s): Zhu XF (Zhu Xianfang)
Data(s)

2006

Resumo

An internal shrinkage of nanocavity in silicon was in situ observed under irradiation of energetic electron on electron transmission microscopy. Because there is no addition of any external materials to cavity site, a predicted nanosize effect on the shrinkage was observed. At the same time, because there is no ion cascade effect as encountered in the previous ion irradiation-induced nanocavity shrinkage experiment, the electron irradiation-induced instability of nanocavity also provides a further more convincing evidence to demonstrate the predicted irradiation-induced athermal activation effect. (c) 2006 American Institute of Physics.

Identificador

http://ir.semi.ac.cn/handle/172111/10460

http://www.irgrid.ac.cn/handle/1471x/64426

Idioma(s)

英语

Fonte

Zhu XF (Zhu Xianfang) .Shrinkage of nanocavities in silicon during electron beam irradiation ,JOURNAL OF APPLIED PHYSICS,2006 ,100(3):Art.No.034304

Palavras-Chave #半导体物理 #PREFERENTIAL AMORPHIZATION #ION IRRADIATION #AMORPHOUS SI #IN-SITU #VOIDS
Tipo

期刊论文