Non-exponential photoluminescence decay dynamics of localized carriers in disordered InGaN/GaN quantum wells: the role of localization length


Autoria(s): Wang, YJ (Wang, Y. J.); Xu, SJ (Xu, S. J.); Zhao, DG (Zhao, D. G.); Zhu, JJ (Zhu, J. J.); Yang, H (Yang, H.); Shan, XD (Shan, X. D.); Yu, DP (Yu, D. P.)
Data(s)

2006

Resumo

In this article, we report a combined experimental and theoretical study on the luminescence dynamics of localized carriers in disordered InGaN/GaN quantum wells. The luminescence intensity of localized carriers is found to exhibit an unusual non-exponential decay. Adopting a new model taking the radiative recombination and phonon-assisted hopping transition between different localized states into account, which was recently developed by Rubel et al., the non-exponential decay behavior of the carriers can be quantitatively interpreted. Combining with precise structure characterization, the theoretical simulations show that the localization length of localized carriers is a key parameter governing their luminescence decay dynamics. (c) 2006 Optical Society of America.

Identificador

http://ir.semi.ac.cn/handle/172111/9734

http://www.irgrid.ac.cn/handle/1471x/64279

Idioma(s)

英语

Fonte

Wang, YJ (Wang, Y. J.); Xu, SJ (Xu, S. J.); Zhao, DG (Zhao, D. G.); Zhu, JJ (Zhu, J. J.); Yang, H (Yang, H.); Shan, XD (Shan, X. D.); Yu, DP (Yu, D. P.) .Non-exponential photoluminescence decay dynamics of localized carriers in disordered InGaN/GaN quantum wells: the role of localization length ,OPTICS EXPRESS,DEC 25 2006,14 (26):13151-13157

Palavras-Chave #光电子学 #TIME-RESOLVED PHOTOLUMINESCENCE
Tipo

期刊论文