Effect of layer thickness of immiscible alloy In0.52Al0.48As on the morphology of InAs nanostructure grown on In0.52Al0.48As/InP(001)


Autoria(s): Zhao FA; Chen YH; Ye XL; Xu B; Jin P; Wu J; Wang ZG; Zhang CL
Data(s)

2005

Resumo

Thickness effect of immiscible alloy InAlAs as matrix layer on the morphology of InAs nanostructure grown on InAlAs/InP (0 0 1) by solid-source molecular-beam epitaxy has been studied. Experiments demonstrate that InAs nanostructure grown on thin InAlAs matrix layer forms randomly distributed quantum dot, whereas, grown on thick InAlAs matrix layer forms one-dimension ordered mixture of quantum wire and quantum dot. This drastic modification in the nanostructure morphology is attributed to the generation of composition modulation in the immiscible InAlAs alloy with the increase of the layer thickness. (C) 2004 Elsevier B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/8904

http://www.irgrid.ac.cn/handle/1471x/63982

Idioma(s)

英语

Fonte

Zhao, FA; Chen, YH; Ye, XL; Xu, B; Jin, P; Wu, J; Wang, ZG; Zhang, CL .Effect of layer thickness of immiscible alloy In0.52Al0.48As on the morphology of InAs nanostructure grown on In0.52Al0.48As/InP(001) ,JOURNAL OF CRYSTAL GROWTH,JAN 3 2005,273 (3-4):494-499

Palavras-Chave #半导体材料 #nanostructures
Tipo

期刊论文