Correlation between Er3+ emission and Si clusters in Erbium-doped a-SiOx : H films


Autoria(s): Chen CY; Chen WD; Song SF; Xu ZJ; Liao XB; Li GH; Bian LF; Ding K
Data(s)

2005

Resumo

Erbium-doped hydrogenated amorphous silicon suboxide films containing silicon clusters (a-SiOx:H) were prepared. The samples exhibited photoluminescence (PL) peaks at around 750nm and 1.54 mu m, which could be assigned to the electron-hole recombination in silicon clusters and the intra-4f transition in Er3+, respectively. We compared annealing behaviors of Si clusters and Er3+ emission and found that Si clusters emission depends strongly upon crystallinity of Si clusters, whereas Er3+ emission is not sensitive to whether it is Si nanocrystals (nc-Si) or amorphous Si (a-Si) clusters. The erbium-doped a-SiOx:H films containing either a-Si clusters or nc-Si have the same kind of Er3+ -emitting centers. Based on these results, it is concluded that a-Si clusters can play the same role on Er3+ excitation as nc-Si. (c) 2004 Elsevier B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/8828

http://www.irgrid.ac.cn/handle/1471x/63944

Idioma(s)

英语

Fonte

Chen, CY; Chen, WD; Song, SF; Xu, ZJ; Liao, XB; Li, GH; Bian, LF; Ding, K .Correlation between Er3+ emission and Si clusters in Erbium-doped a-SiOx : H films ,PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES,MAR 2005,27 (1-2):21-25

Palavras-Chave #半导体物理 #Si clusters
Tipo

期刊论文