In-situ resistivity measurement of ZnS in diamond anvil cell under high pressure


Autoria(s): Han, YH; Luo, JF; Hao, AM; Gao, CX; Xie, HS; Qu, SC; Liu, HW; Zou, GT
Data(s)

2005

Resumo

An effective method is developed to fabricate metallic microcircuits in diamond anvil cell (DAC) for resistivity measurement under high pressure. The resistivity of nanocrystal ZnS is measured under high pressure up to 36.4 GPa by using designed DAC. The reversibility and hysteresis of the phase transition are observed. The experimental data is confirmed by an electric current field analysis accurately. The method used here can also be used under both ultrahigh pressure and high temperature conditions.

Identificador

http://ir.semi.ac.cn/handle/172111/8802

http://www.irgrid.ac.cn/handle/1471x/63931

Idioma(s)

英语

Fonte

Han, YH; Luo, JF; Hao, AM; Gao, CX; Xie, HS; Qu, SC; Liu, HW; Zou, GT .In-situ resistivity measurement of ZnS in diamond anvil cell under high pressure ,CHINESE PHYSICS LETTERS,APR 2005,22 (4):927-930

Palavras-Chave #半导体材料 #SUPERCONDUCTIVITY
Tipo

期刊论文