Silica and alumina thin films grown by liquid phase deposition


Autoria(s): Sun, J; Hu, LZ; Wang, ZY; Du, GT
Data(s)

2005

Resumo

This work demonstrates the condition optimization during liquid phase deposition (LPD) Of SiO2/GaAs films. LPD method is further applied to form Al2O3 films on semiconductors with poison-free materials. Proceeding at room temperature with inexpensive equipment, LPD of silica and alumina films is potentially serviceable in microelectronics and related spheres.

Identificador

http://ir.semi.ac.cn/handle/172111/8762

http://www.irgrid.ac.cn/handle/1471x/63911

Idioma(s)

英语

Fonte

Sun, J; Hu, LZ; Wang, ZY; Du, GT .Silica and alumina thin films grown by liquid phase deposition ,PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING,2005,PTS 1-5(475-479):1725-1728

Palavras-Chave #半导体材料 #silica #alumina #liquid phase deposition #semiconductors #ELECTRICAL CHARACTERISTICS #DIOXIDE FILMS #OXIDE-FILMS
Tipo

期刊论文