Silica and alumina thin films grown by liquid phase deposition
Data(s) |
2005
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Resumo |
This work demonstrates the condition optimization during liquid phase deposition (LPD) Of SiO2/GaAs films. LPD method is further applied to form Al2O3 films on semiconductors with poison-free materials. Proceeding at room temperature with inexpensive equipment, LPD of silica and alumina films is potentially serviceable in microelectronics and related spheres. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Sun, J; Hu, LZ; Wang, ZY; Du, GT .Silica and alumina thin films grown by liquid phase deposition ,PRICM 5: THE FIFTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING,2005,PTS 1-5(475-479):1725-1728 |
Palavras-Chave | #半导体材料 #silica #alumina #liquid phase deposition #semiconductors #ELECTRICAL CHARACTERISTICS #DIOXIDE FILMS #OXIDE-FILMS |
Tipo |
期刊论文 |