Nucleation of diamond by pure carbon ion bombardment - a transmission electron microscopy study
Data(s) |
2005
|
---|---|
Resumo |
A cross-sectional high-resolution transmission electron microscopy (HRTEM) study of a film deposited by a 1 keV mass-selected carbon ion beam onto silicon held at 800 degrees C is presented. Initially, a graphitic film with its basal planes perpendicular to the substrate is evolving. The precipitation of nanodiamond crystallites in upper layers is confirmed by HRTEM, selected area electron diffraction, and electron energy loss spectroscopy. The nucleation of diamond on graphitic edges as predicted by Lambrecht [W. R. L. Lambrecht, C. H. Lee, B. Segall, J. C. Angus, Z. Li, and M. Sunkara, Nature, 364 607 (1993)] is experimentally confirmed. The results are discussed in terms of our recent subplantation-based diamond nucleation model. (c) 2005 American Institute of Physics. |
Identificador | |
Idioma(s) |
英语 |
Fonte |
Yao, Y; Liao, MY; Wang, ZG; Lifshitz, Y; Lee, ST .Nucleation of diamond by pure carbon ion bombardment - a transmission electron microscopy study ,APPLIED PHYSICS LETTERS,AUG 8 2005,87 (6):Art.No.063103 |
Palavras-Chave | #半导体材料 #BEAM DEPOSITION |
Tipo |
期刊论文 |