Nucleation of diamond by pure carbon ion bombardment - a transmission electron microscopy study


Autoria(s): Yao, Y; Liao, MY; Wang, ZG; Lifshitz, Y; Lee, ST
Data(s)

2005

Resumo

A cross-sectional high-resolution transmission electron microscopy (HRTEM) study of a film deposited by a 1 keV mass-selected carbon ion beam onto silicon held at 800 degrees C is presented. Initially, a graphitic film with its basal planes perpendicular to the substrate is evolving. The precipitation of nanodiamond crystallites in upper layers is confirmed by HRTEM, selected area electron diffraction, and electron energy loss spectroscopy. The nucleation of diamond on graphitic edges as predicted by Lambrecht [W. R. L. Lambrecht, C. H. Lee, B. Segall, J. C. Angus, Z. Li, and M. Sunkara, Nature, 364 607 (1993)] is experimentally confirmed. The results are discussed in terms of our recent subplantation-based diamond nucleation model. (c) 2005 American Institute of Physics.

Identificador

http://ir.semi.ac.cn/handle/172111/8606

http://www.irgrid.ac.cn/handle/1471x/63833

Idioma(s)

英语

Fonte

Yao, Y; Liao, MY; Wang, ZG; Lifshitz, Y; Lee, ST .Nucleation of diamond by pure carbon ion bombardment - a transmission electron microscopy study ,APPLIED PHYSICS LETTERS,AUG 8 2005,87 (6):Art.No.063103

Palavras-Chave #半导体材料 #BEAM DEPOSITION
Tipo

期刊论文