Comparative study of InAs quantum dots grown on different GaAs substrates by MOCVD


Autoria(s): Liang, S; Zhu, HL; Pan, JQ; Hou, LP; Wang, W
Data(s)

2005

Resumo

We present a comparative study of InAs quantum dots grown on Si-doped GaAs (10 0) substrates, Si-doped GaAs (10 0) vicinal substrates, and semi-insulating GaAs (10 0) substrates. The density and size distribution of quantum dots varied greatly with the different substrates used. While dots on exact substrates showed only one dominant size, a clear bimodal size distribution of the InAs quantum dots was observed on GaAs vicinal substrates, which is attributed to the reduced surface diffusion due to the presence of multiatomic steps. The emission wavelength is blueshifted during the growth of GaAs cap layer with a significant narrowing of FWHM. We found that the blueshift is smaller for QDs grown on GaAs (10 0) vicinal substrates than that for dots on exact GaAs (100) substrates. This is attributed to the energy barrier formed at the multiatomic step kinks which prohibits the migration of In adatoms during the early stage of cap layer growth. (c) 2005 Elsevier B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/8570

http://www.irgrid.ac.cn/handle/1471x/63815

Idioma(s)

英语

Fonte

Liang, S; Zhu, HL; Pan, JQ; Hou, LP; Wang, W .Comparative study of InAs quantum dots grown on different GaAs substrates by MOCVD ,JOURNAL OF CRYSTAL GROWTH,SEP 1 2005,282 (3-4):297-304

Palavras-Chave #光电子学 #bimodal size distribution
Tipo

期刊论文