Optical waveguide propagation loss measurement using multiple reflections method


Autoria(s): Chen SW; Yan QF; Xu QY; Fan ZC; Liu JW
Data(s)

2005

Resumo

Optical waveguide propagation loss measurement method based on optical multiple reflections detection is presented in this paper. By using a precision reflectometer, uncertain influence on waveguide propagation loss measurement caused by fiber-waveguide coupling can be eliminated effectively and the waveguide net propagation loss can be measured accurately. To demonstrate this, the propagation loss of a Silicon-on-Insulator (SOI) rib waveguide fabricated by RIE is measured with the obtained value being 4.3 dB/cm. This method provides a non-destructive means for evaluating waveguide propagation loss. (c) 2005 Elsevier B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/8406

http://www.irgrid.ac.cn/handle/1471x/63733

Idioma(s)

英语

Fonte

Chen, SW; Yan, QF; Xu, QY; Fan, ZC; Liu, JW .Optical waveguide propagation loss measurement using multiple reflections method ,OPTICS COMMUNICATIONS,DEC 1 2005,256 (1-3):68-72

Palavras-Chave #光电子学 #optical waveguide
Tipo

期刊论文