Influence of nitrogen annealing on electrical properties of lead zirconate titanate thin film deposited on titanium metal foil


Autoria(s): Zhang, GQ; Zou, Q; Sun, P; Mei, X; Ruda, HE
Data(s)

2004

Resumo

We report on improved electrical properties of lead zirconate titanate (PZT) film deposited on titanium metal foil using nitrogen annealing. After nitrogen annealing of the PZT capacitors, symmetric capacitance-voltage (C-V) characteristics, higher dielectric constant and breakdown field, less change of dielectric constant with frequency, lower dielectric loss and leakage current are obtained. (C) 2003 Elsevier B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/8206

http://www.irgrid.ac.cn/handle/1471x/63697

Idioma(s)

英语

Fonte

Zhang, GQ; Zou, Q; Sun, P; Mei, X; Ruda, HE .Influence of nitrogen annealing on electrical properties of lead zirconate titanate thin film deposited on titanium metal foil ,MATERIALS LETTERS,FEB 2004,58 (5):706-710

Palavras-Chave #半导体材料 #ferroelectrics
Tipo

期刊论文