Experimental verification on the origin of plateau-like current-voltage characteristics of resonant tunneling diodes


Autoria(s): Qiu ZJ; Gui YS; Guo SL; Dai N; Chu JH; Zhang XX; Zeng YP
Data(s)

2004

Resumo

Current-voltage (I-V) characteristics of GaAs-based resonant tunneling diodes have been investigated in the presence of a perpendicular magnetic field. Electron resonant tunneling is strongly suppressed by the applied magnetic field, leading to peak current decreasing with increasing magnetic field. The observed plateau-like structures appear in negative differential resistance region on the I-V curves and are magnetic-field dependent. The plateau-like structures are due to the coupling between the energy levels in the emitter well and in the main quantum well. (C) 2004 American Institute of Physics.

Identificador

http://ir.semi.ac.cn/handle/172111/8156

http://www.irgrid.ac.cn/handle/1471x/63672

Idioma(s)

英语

Fonte

Qiu, ZJ; Gui, YS; Guo, SL; Dai, N; Chu, JH; Zhang, XX; Zeng, YP .Experimental verification on the origin of plateau-like current-voltage characteristics of resonant tunneling diodes ,APPLIED PHYSICS LETTERS,MAR 15 2004,84 (11):1961-1963

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Tipo

期刊论文