Investigation of Mn-implanted n-type Ge


Autoria(s): Liu LF; Chen NF; Yin ZG; Yang F; Zhou JP; Zhang FQ
Data(s)

2004

Resumo

Mn+ irons were implanted to n-type Ge(1 1 1) single crystal at room temperature with an energy of 100 keV and a dose of 3 x 10(16) cm(-2). Subsequently annealing was performed at 400degreesC for 1 h under flowing nitrogen gas. X-ray diffraction measurements show that as-implanted sample is amorphous and the structure of crystal is restored after annealing. Polycrystalline germanium is formed in annealed sample. There are no new phases found except germanium. The samples surface morphologies indicate that annealed sample has island-like feature while there is no such kind of characteristic in as-implanted sample. The elemental composition of annealed sample was analyzed by Auger electron spectroscopy. It shows that manganese ions are deeply implanted into germanium substrate and the highest manganese atomic concentration is 8% at the depth of 120 nm. The magnetic properties of samples were investigated by an alternating gradient magnetometer. The annealed sample shows ferromagnetic behavior at room temperature. (C) 2004 Elsevier B.V. All rights reserved.

Identificador

http://ir.semi.ac.cn/handle/172111/8076

http://www.irgrid.ac.cn/handle/1471x/63632

Idioma(s)

英语

Fonte

Liu, LF; Chen, NF; Yin, ZG; Yang, F; Zhou, JP; Zhang, FQ .Investigation of Mn-implanted n-type Ge ,JOURNAL OF CRYSTAL GROWTH,MAY 1 2004,265 (3-4):466-470

Palavras-Chave #半导体材料 #Auger electron spectroscopy
Tipo

期刊论文