Quantum mechanical simulation of nanosized metal-oxide-semiconductor field-effect transistor using empirical pseudopotentials: A comparison for charge density occupation methods


Autoria(s): Jiang XW (Jiang Xiang-Wei); Deng HX (Deng Hui-Xiong); Li SS (Li Shu-Shen); Luo JW (Luo Jun-Wei); Wang LW (Wang Lin-Wang)
Data(s)

2009

Resumo

The atomistic pseudopotential quantum mechanical calculations are used to study the transport in million atom nanosized metal-oxide-semiconductor field-effect transistors. In the charge self-consistent calculation, the quantum mechanical eigenstates of closed systems instead of scattering states of open systems are calculated. The question of how to use these eigenstates to simulate a nonequilibrium system, and how to calculate the electric currents, is addressed. Two methods to occupy the electron eigenstates to yield the charge density in a nonequilibrium condition are tested and compared. One is a partition method and another is a quasi-Fermi level method. Two methods are also used to evaluate the current: one uses the ballistic and tunneling current approximation, another uses the drift-diffusion method. (C) 2009 American Institute of Physics. [doi:10.1063/1.3248262]

National Basic Research Program of China G2009CB929300 National Natural Science Foundation of China 60821061 60776061U.S. Department of Energy BES, Office of Science DE-AC02-05CH11231

Identificador

http://ir.semi.ac.cn/handle/172111/7555

http://www.irgrid.ac.cn/handle/1471x/63514

Idioma(s)

英语

Fonte

Jiang, XW (Jiang, Xiang-Wei); Deng, HX (Deng, Hui-Xiong); Li, SS (Li, Shu-Shen); Luo, JW (Luo, Jun-Wei); Wang, LW (Wang, Lin-Wang) .Quantum mechanical simulation of nanosized metal-oxide-semiconductor field-effect transistor using empirical pseudopotentials: A comparison for charge density occupation methods ,JOURNAL OF APPLIED PHYSICS,OCT 15 2009,106(8):Art.No.084510

Palavras-Chave #半导体物理 #ELECTRONIC-STRUCTURE
Tipo

期刊论文