Correlations between antibunching and blinking of photoluminescence from a single CdSe quantum dot


Autoria(s): Xu, XS (Xu, X. S.); Yamada, T (Yamada, T.); Yokoyama, S (Yokoyama, S.)
Data(s)

2009

Resumo

The antibunching and blinking from a single CdSe/ZnS nanocrystal with an emission wavelength of 655 nm were investigated under different excitation powers. The decay process of the photoluminescence from nanocrystal was fitted into a stretched exponential, and the small lifetime and the small stretching exponent under a high excitation power were explained by using nonradiative multi-channel model. The probability of distributions for off-times from photoluminescence intermittence was fitted into the power law, and the power exponents were explained by using a tunneling model. For higher excitation power, the Auger-assisted tunneling model takes effect, where the tunneling rate increases and the observed lifetime decreases. For weak excitation power, the electron directly tunnels between the nanocrystal and trapping state without Auger assistance. The correlation between antibunching and blinking from the same nanocrystal was analyzed.

National Nature Science Foundation of China 60537010 6073603760877030National Basic Research Program of China 2009CB320300 National High Technology Research and Development Program of China 2009AA03Z406

Identificador

http://ir.semi.ac.cn/handle/172111/7523

http://www.irgrid.ac.cn/handle/1471x/63498

Idioma(s)

英语

Fonte

Xu, XS (Xu, X. S.); Yamada, T (Yamada, T.); Yokoyama, S (Yokoyama, S.) .Correlations between antibunching and blinking of photoluminescence from a single CdSe quantum dot ,EUROPEAN PHYSICAL JOURNAL D,DEC 2009 ,55(3):691-697

Palavras-Chave #半导体物理 #FLUORESCENCE
Tipo

期刊论文