Determination of MgO/AlN heterojunction band offsets by x-ray photoelectron spectroscopy (vol 94, 052101, 2009)


Autoria(s): Yang AL; Song HP; Liu XL; Wei HY; Guo Y; Zheng GL; Jiao CM; Yang SY; Zhu QS; Wang ZG
Data(s)

2009

Identificador

http://ir.semi.ac.cn/handle/172111/7279

http://www.irgrid.ac.cn/handle/1471x/63377

Idioma(s)

英语

Fonte

Yang AL ; Song HP ; Liu XL ; Wei HY ; Guo Y ; Zheng GL ; Jiao CM ; Yang SY ; Zhu QS ; Wang ZG .Determination of MgO/AlN heterojunction band offsets by x-ray photoelectron spectroscopy (vol 94, 052101, 2009) ,APPLIED PHYSICS LETTERS,2009 ,94(12):Art. No. 129901

Palavras-Chave #半导体材料 #aluminium compounds #core levels #III-V semiconductors #magnesium compounds #semiconductor heterojunctions #semiconductor-insulator boundaries #X-ray photoelectron spectra
Tipo

期刊论文