Transport properties in a gated heterostructure with a trapezoidal AlxGa1-xAs barrier layer


Autoria(s): Tan XT; Zheng HZ; Liu J; Zhu H; Xu P; Li GR; Yang FH
Data(s)

2009

Resumo

By replacing the flat (Ga1-xAlx)As barrier layer with a trapezoidal AlxGa1-xAs barrier layer, a conventional heterostructure can be operated in enhancement mode. The sheet density of two-dimensional electron gas (2DEG) in the structure can be tuned linearly from N-2D = 0.3 x 10(11) cm(-2) to N-2D = 4.3 x 10(11) cm(-2) by changing the bias on the top gate. The present scheme for gated heterostructures is easy to fabricate and does not require the use of self-alignment photolithography or the deposition of insulating layers. In addition, this scheme facilitates the initial electrical contact to 2DEG. Although, the highest electron mobility obtained for the moment is limited by the background doping level of heterostructures, the mobility should be improved substantially in the future. (C) 2009 Elsevier B.V. All rights reserved.

National Basic Research Program of China 2006CB932801 2007CB924903 2007CB924904 Special Research Programs of Chinese Academy of Sciences the Knowledge Innovation Program Project of Chinese Academy of Sciences KJCX.YW.W09

Identificador

http://ir.semi.ac.cn/handle/172111/7065

http://www.irgrid.ac.cn/handle/1471x/63270

Idioma(s)

英语

Fonte

Tan XT ; Zheng HZ ; Liu J ; Zhu H ; Xu P ; Li GR ; Yang FH .Transport properties in a gated heterostructure with a trapezoidal AlxGa1-xAs barrier layer ,PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES,2009 ,41(8):1379-1381

Palavras-Chave #半导体材料 #HEMT #2DEG
Tipo

期刊论文