Effects of the morphology of ZnO/Ag interface on the surface-plasmon-enhanced emission of ZnO films


Autoria(s): You JB; Zhang XW; Fan YM; Yin ZG; Cai PF; Chen NF
Data(s)

2008

Resumo

The effects of the surface morphology of Ag on the surface-plasmon-enhanced emission of ZnO films have been studied for a ZnO/Ag/Si system by photoluminescence spectroscopy and atomic force microscopy. The results indicate that the enhancement of ZnO ultraviolet emission is dependent on the deposition conditions of the Ag interlayers. By examining the dependence of the enhancement ratio of surface-plasmon-mediated emission on the characteristic parameters of Ag surface morphology, we found that the surface plasmon coupling to light is determined by both the Ag particle size and density.

Hundred Talents Program Chinese Academy of Sciences 2006AA03Z306 National Natural Science Foundation of China 50601025 This work was supported by the Hundred Talents Program Chinese Academy of Sciences, the '863' Project of China (2006AA03Z306) and the National Natural Science Foundation of China (50601025).

Identificador

http://ir.semi.ac.cn/handle/172111/6386

http://www.irgrid.ac.cn/handle/1471x/62931

Idioma(s)

英语

Fonte

You, JB ; Zhang, XW ; Fan, YM ; Yin, ZG ; Cai, PF ; Chen, NF .Effects of the morphology of ZnO/Ag interface on the surface-plasmon-enhanced emission of ZnO films ,JOURNAL OF PHYSICS D-APPLIED PHYSICS,2008 ,41(20): Art. No. 205101

Palavras-Chave #半导体物理 #LIGHT-EMITTING-DIODES
Tipo

期刊论文