鉴别样品是否含有微小半导体碳纳米管束的方法
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19/11/2008
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| Resumo |
Submitted by zhangdi (zhangdi@red.semi.ac.cn) on 2009-06-04T08:36:34Z No. of bitstreams: 1 dspace.cfg: 33388 bytes, checksum: ac9630d3fdb36a155287a049e8b34eb7 (MD5) Made available in DSpace on 2009-06-04T08:36:35Z (GMT). No. of bitstreams: 1 dspace.cfg: 33388 bytes, checksum: ac9630d3fdb36a155287a049e8b34eb7 (MD5) Previous issue date: 2008-08 Made available in DSpace on 2009-06-11T08:58:30Z (GMT). No. of bitstreams: 1 full/CN200710099288.2.pdf: 475990 bytes, checksum: e104b3bd2870a937672adc2ccd1604d0 (MD5) Previous issue date: |
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| Idioma(s) |
中文 |
| Fonte |
谭平恒;张俊;李桂荣,鉴别样品是否含有微小半导体碳纳米管束的方法,CN200710099288.2,20070516 |
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专利 |
